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        • Product name: Nd:YLF
        • Product ID: 113
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        Nd:YLF Crystal
        CASTECH grows Nd:YLF crystals using Czochralski method.The use of high quality starting materials for crystal growth, whole boule interferometry,and precise inspection of scattering particle in crystal using He-Ne lsaer assures that each crystal will perform well. 

        Optical Properties

        Transparency range: 180-6700nm

        Peak Stimulated Emission Cross Section

        1.8x1o-19xcm2(E‖C)at 1064nm
        1.2x1o-19xcm2(EC)at 1053nm

        Spontaneous Fluorescence Lifetime 485μs for 1% Nd doping
        Seatter Losses <0.2%/cm
        Peak Absorption Coefficient(for 1.2% Nd)

        a=10.8cm-1(792.0 nm E‖C)
        a=3.59cm-1(797.0 nm EC)

        Laser Wavelegth

        1047nm(‖c,a-cut crystal)
        1053nm(c,a or c-cut crystal)

        Physical Properties

        Chemical Formula LiY1.0-xNdxF4
        Space Group


        Nd atoms/m3

        1.40X1020atoms/cm3 for 1% Nd doping

        Modulus of Elasticity 85 GPa
        Crystal Structure: tetragonal
        Cell Parameters: a=5.16Å,c=10.85Â
        Melting Point: 819℃
        Mohs Hardness: 4~5
        Density: 3.99g/cm3
        Thermal Conductivity 0.063W/cm K
        Specific Heat 0.79J/gK
        Thermal conductivity


        Index of Refraction

        Wavelength(nm) no ne
        262 1.485 1.511
        350 1.473 1.491
        525 1.456 1.479
        1050 1.448 1.470
        2065 1.442 1.464


        Wavelength(nm) E‖c Ec
        436 -2.44x10-6/℃








        The Sellmeier equations(λ in μm):


        CASTECH’s general Nd:YLF production capabilities including

        • Rod sizes from 2mm to 10mm in diameter and from 1mm to 150mm in length
        • Orientation of rod axis to crystal axis within 1 degree
        • Polished only or AR coated rods
        • Nd dopant concentrations between 0.4 and 1.2at%
        • Large rod and slab dimensions and non-standard dopant concentrations are available upon request


        Standard Dopant 1.1±0.1%
        Wavefront Distortion <λ/4 per inch @633nm
        Parallelism <10 arc seconds
        Perpendicularity <5 arc minutes
        chamfer 0.13±0.07mm@45°
        Surface Quality 10/5(MIL-PRF-13830B)
        End Coating R<0.15%@1047/1053nm
        Surface Flatness λ/8@632.8nm