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Acousto-Optic Deflectors

Devices designed specifically for high-speed solid-state scanning of light beams
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Devices designed specifically for high-speed solid-state scanning of light beams

Acousto-optic deflectors (AODF) can achieve laser beam scanning by changing the RF driving frequency, and the scanning position can achieve random position, continuous line scanning, and sequential point deflection. Depending on crystal, wavelength, and beam size, scan rates in excess of 200 MHz can be achieved, along with precise position control of nRad.
The optimal efficiency of an AOD typically requires the input laser beam to be set at a Bragg angle, when scanning the laser beam a Bragg angle mismatch occurs, this is due to the fact that the AOD can only be optically aligned at one drive frequency. This generally results in lower efficiency. CASTECH's team has the design experience to cleverly solve the problem, such as using longitudinal modes and using phased array piezoelectric cells within the transducer to design and produce large bandwidth AODs with high resolution.
We design AOD for 1D and 2D scanning, and together with the specially developed broadband RF driver, we can realize various control methods such as frequency sweeping and chirping, which makes it easy for customers to realize multiple functions quickly.

 

Applications:

●Laser  display            

●Micromachining            

●Heterodyne interferometer  

●Laser tweezers      

●Optical inspection

●Heterodyne

 

CASTECH's products are produced independently throughout the entire process and can be customized according to customer needs. Refer to the following list for standard products.

Keyword:
low insertion loss
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Model Number:

 

1D-Deflectors  CADF-f-r-a-mt-w-cn-h

2D-Deflectors  CADFD-f-r-a-mt-w-cn-h

Center Frequency(f)

RF Range(r)

Aperture

(a)

Material

(m)

Mode

(t)

Wavelength (w)

RFConnector

(c)

Number of connectors

(n) *

Housing

(h)

070 (70MHz)

10 (±10 MHz)

010 (1 mm)

CQ (Crystalline Quartz)

TE (TeO2

C (Compressional)

S (Shear)

266 (266nm)

AF (SMA-F)

D(Double-Input)

A33

* Only applicable to dual RF type acoustooptic deflectors

 

Typical Specifications

Wavelength

Aperture

Operation frequency

Scan dimensions

Scanning Angle

Diffraction Efficiency

Material

266 nm

1×26 mm2

210±60 MHz

1D

5.5 mrad

>40 %

CQ

355 nm

7 mm

170±30 MHz

1D

3.7 mrad

>80 %

CQ

364 nm

3.5 mm

100±40 MHz

1D

47 mrad

>50 %

TE

405 nm

4 mm

100±25 MHz

1D

32.4 mrad

>70 %

TE

592 nm

7.5 mm

100±25 MHz

1D

43 mrad

>70 %

TE

813 nm

5 mm

100±20 MHz

1D

50 mrad

>70 %

TE

1064 nm

1-3 mm

90±16 MHz

1D

50 mrad

>80 %

TE

355 nm

7 mm

110±20 MHz

2D

2.2×2.2 mrad

>50 %

CQ

532 nm

10 mm

85±25 MHz

2D

40×40 mrad

>40 %

TE

Housing dimensions(mm):

A33

C66

 

Products

Acousto-Optic Deflectors
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  • Acousto-Optic Deflectors

  • Devices designed specifically for high-speed solid-state scanning of light beams
Description
Parameters
CAS'TechClass
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Devices designed specifically for high-speed solid-state scanning of light beams

Acousto-optic deflectors (AODF) can achieve laser beam scanning by changing the RF driving frequency, and the scanning position can achieve random position, continuous line scanning, and sequential point deflection. Depending on crystal, wavelength, and beam size, scan rates in excess of 200 MHz can be achieved, along with precise position control of nRad.
The optimal efficiency of an AOD typically requires the input laser beam to be set at a Bragg angle, when scanning the laser beam a Bragg angle mismatch occurs, this is due to the fact that the AOD can only be optically aligned at one drive frequency. This generally results in lower efficiency. CASTECH's team has the design experience to cleverly solve the problem, such as using longitudinal modes and using phased array piezoelectric cells within the transducer to design and produce large bandwidth AODs with high resolution.
We design AOD for 1D and 2D scanning, and together with the specially developed broadband RF driver, we can realize various control methods such as frequency sweeping and chirping, which makes it easy for customers to realize multiple functions quickly.

 

Applications:

●Laser  display            

●Micromachining            

●Heterodyne interferometer  

●Laser tweezers      

●Optical inspection

●Heterodyne

 

CASTECH's products are produced independently throughout the entire process and can be customized according to customer needs. Refer to the following list for standard products.

Model Number:

 

1D-Deflectors  CADF-f-r-a-mt-w-cn-h

2D-Deflectors  CADFD-f-r-a-mt-w-cn-h

Center Frequency(f)

RF Range(r)

Aperture

(a)

Material

(m)

Mode

(t)

Wavelength (w)

RFConnector

(c)

Number of connectors

(n) *

Housing

(h)

070 (70MHz)

10 (±10 MHz)

010 (1 mm)

CQ (Crystalline Quartz)

TE (TeO2

C (Compressional)

S (Shear)

266 (266nm)

AF (SMA-F)

D(Double-Input)

A33

* Only applicable to dual RF type acoustooptic deflectors

 

Typical Specifications

Wavelength

Aperture

Operation frequency

Scan dimensions

Scanning Angle

Diffraction Efficiency

Material

266 nm

1×26 mm2

210±60 MHz

1D

5.5 mrad

>40 %

CQ

355 nm

7 mm

170±30 MHz

1D

3.7 mrad

>80 %

CQ

364 nm

3.5 mm

100±40 MHz

1D

47 mrad

>50 %

TE

405 nm

4 mm

100±25 MHz

1D

32.4 mrad

>70 %

TE

592 nm

7.5 mm

100±25 MHz

1D

43 mrad

>70 %

TE

813 nm

5 mm

100±20 MHz

1D

50 mrad

>70 %

TE

1064 nm

1-3 mm

90±16 MHz

1D

50 mrad

>80 %

TE

355 nm

7 mm

110±20 MHz

2D

2.2×2.2 mrad

>50 %

CQ

532 nm

10 mm

85±25 MHz

2D

40×40 mrad

>40 %

TE

Housing dimensions(mm):

A33

C66

 

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