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Nd:YLF - Neodymium Doped Yttrium Lithium Fluoride

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Nd:YLF - Neodymium Doped Yttrium Lithium Fluoride
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  • Nd:YLF - Neodymium Doped Yttrium Lithium Fluoride

  • CASTECH grows Nd:YLF using Czochralski method with high quality starting materials for crystal growth. We inspect the whole boules with interferometry and their scattering particles with He-Ne laser.
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Introduction

CASTECH grows Nd:YLF crystals using Czochralski method. The use of high quality starting materials for crystal growth, whole boule interferometry, and precise inspection of scattering particle in crystal using He-Ne laser assure that each crystal will perform well.

 

CASTECH's general Nd:YLF production capabilities including

  • Rod sizes from 2 mm to 10 mm in diameter and from 1 mm to 150 mm in length
  • Orientation of rod axis to crystal axis <1 degree
  • Polished only or AR coated rods
  • Nd dopant concentrations between 0.4 and 1.2 at%
  • Large rod and slab dimensions and non-standard dopant concentrations are available upon request

 

Table 1. Basic Properties

Chemical Formula

LiY1.0-xNdxF4

Crystal Structure

Tetragonal

Space Group

I41/a

Nd atoms / cm3

1.40 × 1020 atoms/cmfor 1% Nd doping

Modulus of Elasticity

85 GPa

Lattice Parameter

a = 5.16 Å, c = 10.85 Å 

Melting Point

819℃

Mohs Hardness

4~5 Mohs

Density

3.99 g/cm3

Thermal Conductivity 

0.063 W/cm/K

Specific Heat 

0.79 J/g/K

Thermal Expansion Coefficient

8.3 × 10-6 /K∥c, 13.3×10-6 /K⊥c

 

 Table 2. Optical Properties

Transparency Range

180-6700 nm

Peak Stimulated Emission Cross Section

1.8 × 10-19 /cm(E∥c) at 1047 nm

1.2 × 10-19 /cm2  (E⊥c) at 1053 nm

Fluorescence Lifetime 

485 µs for 1% Nd doping

Scatter Losses

< 0.2% /cm

Peak Absorption Coefficient

 (for 1.2% Nd)

α = 10.8 cm-1 (792.0 nm E∥c)

α = 3.59 cm-1 (797.0 nm E⊥c)

Laser Wavelength

1047 nm (∥c, a-cut crystal)

1053 nm (⊥c, a or c-cut crystal)

Sellmeier Equations (λ in µm):

no2 = 1.38757 + 0.70757λ2 / (λ2 - 0.00931) + 0.18849λ2 / (λ- 50.99741)

ne= 1.31021 + 0.84903λ2 / (λ2 - 0.00876) + 0.53607λ2 / (λ2 - 134.9566)

 

Table 3. Index of Refraction

Wavelength (nm)

no

ne

262

1.485

1.511

350

1.473

1.491

525

1.456

1.479

1050

1.448

1.47

2065

1.442

1.464

 

Table 4. dn / dT

Wavelength (nm)

E // c

E ⊥ c

436

-2.44 × 10-6/℃

-0.54 × 10-6/℃

578

-2.86 × 10-6/℃

-0.91 × 10-6/℃

1060

-4.30 × 10-6/℃

-2.00 × 10-6/℃

 

Specifications of Nd:YLF crystal from CASTECH

Table 5. Specifications

Standard Dopant Concentration

Nd: 1.1 ± 0.1%

Surface quality (scratch/dig)

10/5 to MIL-PRF-13830B

Wavefront Distortion

≦ λ/4 @633 nm

Surface Flatness

λ/8 @633 nm

Parallelism

20 arc sec

Perpendicularity

≦ 15 arc min

Chamfer

≦ 0.2 mm × 45°

End Coating

R < 0.15% @1047/1053 nm

 

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